VLSI Testing & Design for Testability (DFT): Complete Course

About this course

Explore the fundamentals of VLSI testing and design for testability (DFT) with this comprehensive, free Udemy course. Learn how to enhance circuit reliability, reduce manufacturing costs, and streamline debugging processes—all from industry experts. Perfect for engineers and students eager to master cutting‑edge semiconductor testing techniques.

What you'll learn

• Master key DFT concepts such as scan chains, built‑in self‑test (BIST), and boundary scan.
• Learn how to design testable circuits that minimize yield loss and accelerate time‑to‑market.
• Apply practical tools and methodologies for fault detection, isolation, and recovery in VLSI designs.
• Gain hands‑on experience with real‑world case studies and industry‑standard verification flows.

Who this is for

This course is ideal for electrical engineers, ASIC designers, and semiconductor test engineers looking to deepen their knowledge of VLSI testability and improve product quality.

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